Hexagonal microstructure (IMAGE)
Caption
Scanning electron microscope (SEM) image of a hexagonal-shaped microstructure fabricated via focused-ion-beam (FIB) technique. The symmetric nature of the device enables a detailed exploration of electronic symmetry in Kagome metals.
Credit
Chunyu Guo, MPSD
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No unauthorised reproduction. For usage enquiries please contact pr@mpsd.mpg.de
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Original content