Figure | Utilizing Ferroionic 2D Materials for Electro-Optic Performance in Silicon Photonic Circuits. (IMAGE)
Caption
a, 3D schematic visualization (ball and stick model) of a-c plane in CCPS structure, b, Transmission electron microscopy (TEM) image along with the selected area diffraction pattern (SADP) of CCPS crystal, c, current-time (I-t) characteristics at ± 5 V along with a schematic representation of Cu distribution d, 3D schematic representation of the Si microring resonator (MRR) design with integrated CCPS, e, the transmission spectra of MRR at a constant voltage of 7 V as the polling time progressed, across all scans, a consistent blue shift in the resonance wavelengths was observed for all fabricated devices. This blue shift implies an electro-optical modulation of the refractive index of the combined Si/CCPS guiding structure, given that thermal heating typically results in a red shift in the Si-MRR resonance wavelength, additionally, the application of a bias across the device does not affect the extinction ratios and the resonance linewidth f, coverage length and change in effective refractive index of the 15 tested devices.
Credit
by Ghada Dushaq, Solomon Serunjogi, Srinivasa R. Tamalampudi, and Mahmoud Rasras
Usage Restrictions
Credit must be given to the creator.
License
CC BY