Cantilever in an atomic force microscope scanning a material's surface (IMAGE)

DOE/Oak Ridge National Laboratory

Cantilever in an atomic force microscope scanning a material's surface

Caption

This artist's rendering depicts a cantilever's sharp tip in an atomic force microscope scanning a material's surface to measure domain wall movement, enhancing understanding of the walls’ dynamic properties.

Credit

Stephen Jesse/ORNL, U.S. Dept. of Energy

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