(a) Schematic of CrMoOx@MSS sample preparation. (b)–(d) TEM images at different sizes, (e) SEM image, (f)–(k) EDS-measured elemental distribution of C (f), Si (g), N (h), Cr (i), O (j), and Mo (k). (IMAGE)

Tsinghua University Press

(a) Schematic of CrMoOx@MSS sample preparation. (b)–(d) TEM images at different sizes, (e) SEM image, (f)–(k) EDS-measured elemental distribution of C (f), Si (g), N (h), Cr (i), O (j), and Mo (k).

Caption

(a) Schematic of CrMoOx@MSS sample preparation. (b)–(d) TEM images at different sizes, (e) SEM image, (f)–(k) EDS-measured elemental distribution of C (f), Si (g), N (h), Cr (i), O (j), and Mo (k).

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Nano Research, Tsinghua University Press

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