Single event effect in carbon nanotube electronics (IMAGE)

Tsinghua University Press

Single event effect in carbon nanotube electronics

Caption

Owing to the nanoscale cross-sections and the special SEE mechanism in CNT FETs, the CNT FETs feature a much strong SEE tolerance. Using a pulse laser as the irradiation source, the CNT FETs and SRAM exhibited an excellent radiation tolerance with a laser threshold energy of 5 nJ/pulse for SEE.

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Nano Research, Tsinghua University Press

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