Illustration of combined materials characterization/device fabrication approach for superconducting qubits (IMAGE)
Caption
Scientists performed transmission electron microscopy and x-ray photoelectron spectroscopy (XPS) at Brookhaven Lab's Center for Functional Nanomaterials and National Synchrotron Light Source II to characterize the properties of niobium thin films made into superconducting qubit devices at Princeton University. A transmission electron microscope image of one of these films is shown in the background; overlaid on this image are XPS spectra (colored lines representing the relative concentrations of niobium metal and various niobium oxides as a function of film depth) and an illustration of a qubit device. Through these and other microscopy and spectroscopy studies, the team identified atomic-scale structural and surface chemistry defects that may be causing loss of quantum information—a hurdle to enabling practical quantum computers.
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Brookhaven National Laboratory
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