Observing the successive polymer chain variation at nanoscale (ca. 10 nm) by the atomic force microscope topography in situ. (IMAGE)

Chinese Academy of Sciences Headquarters

Observing the successive polymer chain variation at nanoscale (ca. 10 nm) by the atomic force microscope topography in situ.

Caption

Observing the successive polymer chain variation at nanoscale (ca. 10 nm) by the atomic force microscope topography in situ. This integrated nanoporous membrane could modulate dynamic electric gating process at sub-2 nm speed.

Credit

TIPC

Usage Restrictions

None

License

Original content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.