(IMAGE)

Paul Scherrer Institute

Caption

Niels Schröter (left) and Vladimir Strocov at one of the experiment stations of the Swiss Light Source SLS at PSI. Here the researchers used soft X-ray angle-resolved photoelectron spectroscopy to measure the electron distribution below the oxide layer of indium arsenide as well as indium antimonide.

Credit

Paul Scherrer Institute/Mahir Dzambegovic

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