(IMAGE) Paul Scherrer Institute Caption Niels Schröter (left) and Vladimir Strocov at one of the experiment stations of the Swiss Light Source SLS at PSI. Here the researchers used soft X-ray angle-resolved photoelectron spectroscopy to measure the electron distribution below the oxide layer of indium arsenide as well as indium antimonide. Credit Paul Scherrer Institute/Mahir Dzambegovic Usage Restrictions PSI provides image and/or video material free of charge for media coverage of the content of the above text. Use of this material for other purposes is not permitted. This also includes the transfer of the image and video material into databases as well as sale by third parties. License Original content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.