Figure 1. Long-duration tip-enhanced Raman imaging for defect analysis of large-sized WS2 layers. (IMAGE)

Institute of Post-LED Photonics, Tokushima University

Figure 1. Long-duration tip-enhanced Raman imaging for defect analysis of large-sized WS2 layers.

Caption

Conventional nanoscale imaging is usually difficult to perform for large, micron-scale samples owing to drifts caused by thermal effects and vibrations. Now, researchers from Japan address this issue with a newly developed imaging system that compensates for such drifts.

Credit

Figure courtesy: Professor Prabhat Verma from Osaka University.

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