Figure 1 (IMAGE)

Pohang University of Science & Technology (POSTECH)

Figure 1

Caption

Defect analyses and logic gates. (a) X-ray photoelectron spectroscopy (XPS) illustrating the Sn status. (b) Hole concentrations and Hall mobilities. (c) Bias-Induced threshold voltage shift. (d) Perovskite/oxide inverter diagram and optical image. (f) Gain. (g-i) NAND and NOR optical images and their output characteristics.

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POSTECH

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