Exposure strategies for improving TPL throughput. (IMAGE)
Caption
a, The classical point-by-point exposure. b, Layer-by-layer exposure. c, Multi-beam exposure.
Credit
by Shaoliang Yu, Qingyang Du, Cleber Renato Mendonca, Luigi Ranno, Tian Gu and Juejun Hu
Usage Restrictions
Credit must be given to the creator.
License
CC BY