STEM images and schematic (IMAGE)

DOE/Brookhaven National Laboratory

STEM images and schematic

Caption

Left: This scanning transmission electron microscope (STEM) image of a tantalum (Ta) film surface shows an amorphous oxide above the regularly arrayed atoms of crystalline Ta metal. Right: The STEM imaging combined with computational modeling revealed details of the interface between these layers, including the formation of the amorphous oxide (top layer) and a suboxide layer that retains crystalline features (second layer) above the regularly arrayed tantalum atoms.

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Brookhaven National Laboratory

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