Active layers in the thin-film solar cell (IMAGE) Uppsala University Caption The image shows a cross-section of the active layers in the thin-film solar cell, with a total thickness of no more than 3 micrometres. Using nano-XRF measured at the MAX IV facility in Lund, it is possible to measure the concentration of both matrix elements and trace elements (in this case rubidium) in the solar cell with high accuracy. Credit Marika Edoff Usage Restrictions Credit must be given to the creator. License CC BY Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.