Figure 3: Noise equivalent power (NEP) spectra of the two detectors across different frequency bands. (IMAGE)

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Jiaqi Zhu
University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China. Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, Zhejiang 310024, China.
jiaqizhu@ucas.ac.cn

Weien Lai
School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, Anhui 230009, China.
wnlai@hfut.edu.cn

Zhiming Huang
State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China. University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China. Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, Zhejiang 310024, China.
zmhuang@mail.sitp.ac.cn

Huizhen Wu
Zhejiang Key Laboratory of Micro-nano Quantum Chips and Quantum Control, School of Physics, and State Key Laboratory of Silicon and Advanced Semiconductor Materials, Zhejiang University, Hangzhou 310058, China. Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, Zhejiang 310024, China.
hzwu@zju.edu.cn

Figure 3: Noise equivalent power (NEP) spectra of the two detectors across different frequency bands. (IMAGE)

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