Design of the M-PCM radiative cooling ultrathin film (IMAGE)

Chinese Society for Optical Engineering

Design of the M-PCM radiative cooling ultrathin film

Caption

Fig. 1. Design of the M-PCM radiative cooling ultrathin film. (a) The proposed M-PCM film consisting of the PDMS elastomer embedded with a monolayer of SiO2 microsphere array on the top and an Ag back reflector. (b) Refractive index and extinction coefficients of PDMS and SiO2. (c) The normalized scattering cross-section of a single 10 µm-diameter SiO2 microsphere on the top of the PDMS with various embedding depths (inset: the schematic diagram of its corresponding structure). (d) The simulated solar reflectivity and infrared emissivity of the PDMS/Ag, SiO2/PDMS/Ag and M-PCM film structures in the normalized Air Mass Global (AM 1.5G) solar spectrum and the longwave infrared atmospheric transparency window. (e-g) The schematic diagrams of the PDMS/Ag structure, the SiO2/PDMS/Ag structure, and the M-PCM film structure with 3/4 SiO2 microspheres embedded, along with the corresponding electric field intensity profiles of the central cross-sectional (x, z)-plane at the peak wavelengths. The represented wavelengths for each structure are noted above the electric field intensity profiles.

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PhotoniX

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