Pic 3 (IMAGE)

National Research Council of Science & Technology

Pic 3

Caption

▲ The research team behind the development of purity analysis technology for high-purity semiconductor process gases

 

(Clockwise from back left: Mr. Kim Jae Ho, Student Researcher; Mr. Kim Sun Woo, Senior Engineer; Mr. Lee Seung Hyung, Student Researcher; Dr. Oh Sang Hyub, Principal Research Scientist; and Dr. Ho Keon, Senior Research Scientist, all of the Gas Metrology Group at KRISS)

Credit

Korea Research Institute of Standards and Science (KRISS)

Usage Restrictions

The sources of photos and research results from KRISS must be specified.

License

Original content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.