Fig. 3. Knife-edge characterization of focused XUV beam. (IMAGE)

Ultrafast Science

Fig. 3. Knife-edge characterization of focused XUV beam.

Caption

Fig. 3. Knife-edge characterization of focused XUV beam. (a) and (b) APT measurements in the horizontal (X) and vertical (Y) directions, respectively. (c) and (d) IAP measurements showing spot sizes slightly above 1 μm. (e) and (f) IAP measurements  demonstrating submicrometer focusing. The gray cross markers represent raw  accumulated signals, the black circles represent the median-processed intensity values,  and the red lines represent the error function fits. The insets show the corresponding  reconstructed beam profiles obtained from the derivative of the fitted error functions,  representing Gaussian beam profiles.

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Ultrafast Science

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