Topview (IMAGE)

University of Massachusetts Amherst

Topview

Caption

Electromagnetic field simulation looking down at the top of the microring shows how the defect is localized to a region smaller than the entirety of the ring.

Credit

NIST/Lu

Usage Restrictions

none

License

Original content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.