Sensor microforce sensing measurements and deformation distribution simulation. (IMAGE)
Caption
a Evolution of reflection spectra of the sensor as the force increased from 0 to 2700 nN, as indicated by the arrows. b Dip wavelength versus force. The line is the linear fitting of measured data points and the error bar is obtained by critically repeating the experiment of force measurement three times. c Simulation results of deformation distribution based on FEM
Credit
by Mengqiang Zou, Changrui Liao, Shen Liu, Cong Xiong, Cong Zhao, Jinlai Zhao, Zongsong Gan, Yanping Chen, Kaiming Yang, Dan Liu, Ying Wang and Yiping Wang
Usage Restrictions
Credit must be given to the creator.
License
CC BY