Figure 2 | Reconstruction of a multi-layer target, which consists of two test targets located at 1.26 mm and 2.66 mm away from the facet at the measurement side. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Figure 2 | Reconstruction of a multi-layer target, which consists of two test targets located at 1.26 mm and 2.66 mm away from the facet at the measurement side.

Caption

(A) Speckle pattern of the multi-layer target captured on the detection camera. (B) Reconstructed amplitude slides of the sample at different axial distances. (C) Image of the top layer from a bulky reflective microscope. (D-E) Reconstructed (D) amplitude and (E) phase image of the top layer, the linewidth is 22.1 μm. (F) Image of the bottom layer from a bulky reflective microscope. (G-H) Reconstructed (G) amplitude and (H) phase image of the bottom layer, the linewidths are 11.05, 9.84, and 8.77 μm respectively. Scale bars 50 μm.

Credit

by Jiawei Sun, Jiachen Wu, Song Wu, Liangcai Cao, Ruchi Goswami, Salvatore Girardo, Jochen Guck, Nektarios Koukourakis, and Jürgen Czarske

Usage Restrictions

Credit must be given to the creator.

License

CC BY

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