Reflectivity of the artificial antiferromagnet (IMAGE)
Caption
Figure 2: Reflectivity of the artificial antiferromagnet as a function of the normalized angle of incidence, L, of the soft X-ray radiation. The blue and orange circles represent the measured data at different frequencies of the X-ray radiation. The intense reflectivity at L=1 provides direct information about the structural periodicity of the sample and can be measured independently of the light frequency. The increased reflectivity at L=0.5 occurs only for specific, magnetically sensitive light frequencies and is an unambiguous and quantitative measure for determining the strength and periodicity of the antiferromagnetic order in the sample. The blue line shows a very good agreement between experiment and theory.
Credit
MBI
Usage Restrictions
none
License
Original content