SEM-comparision (IMAGE)
Caption
Under the scanning electron microscope (SEM), clear voids can be seen at the grain boundaries of the control perovskite film (left). These defects can lead to losses and reduce the efficiency. With b-pV2F (right) the voids are reduced.
Credit
G. Li/HZB
Usage Restrictions
Credit must be given to the creator. Adaptations must be shared under the same terms.
License
CC BY-SA