KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity​ (IMAGE)

The Korea Advanced Institute of Science and Technology (KAIST)

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity​

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< Conceptual Diagram of Charge Transport and Trap Characterization Using Photo-Hall Measurements (AI-generated image) >

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KAIST

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