KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity​ (IMAGE)

The Korea Advanced Institute of Science and Technology (KAIST)

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity​

Caption

< Conceptual Diagram of the Evolution of Hall Characterization (Analysis) Techniques >

Credit

KAIST

Usage Restrictions

NO

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.