Figure 2 (IMAGE)

Advanced Devices & Instrumentation

Figure 2

Caption

Figure 2. Illustration of the noise model. (a) Fringes without noise interference. (b) Ideal LTC for full-spectrum sampling. (c) Ideal rectangular low-pass filter. (d) Generalized LTC after low-pass sampling. (e) Fringes affected by noise. (f) Generalized LTC affected by noise. (g) Critical condition of successful positioning.

Credit

Advanced Devices & Instrumentation

Usage Restrictions

News organizations may use or redistribute this image, with proper attribution, as part of news coverage of this paper only.

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.