Figure 3 (IMAGE)

Advanced Devices & Instrumentation

Figure 3

Caption

Measurement under complex reflection and transmission conditions using FPP and PSI methods. Captured images, 3D reconstruction results and LTC analysis for special pixels of scenes with (a) mutual reflections (a1 and a2) and overexposure (a3), (b) subsurface scattering, (c) a two-layer scene through a semitransparent surface, and (d) scenes through thin volumetric scattering media.

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Advanced Devices & Instrumentation

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