18-Oct-2026
World’s first simultaneous measurement of nanometer- to submicrometer-scale structures with a single camera using a single X-ray pulse
National Institutes of Natural Sciences
Masato Ota, Assistant Professor at the National Institute for Fusion Science, National Institutes for Natural Sciences (at the time of the research, a graduate student at the Graduate School of Science, Osaka University); Youichi Sakawa, Associate Professor at the Institute of Laser Science, Osaka University; Ryutaro Matsui, Specially Appointed Associate Professor at the National Institute for Fusion Science, National Institutes for Natural Sciences (at the time of the research, Assistant Professor at Kyoto University); Yasuaki Kishimoto, Program-Specific Researcher at the Institute for Chemical Research and Program-Specific Professor at the Institute of Advanced Energy, Kyoto University; Toshinori Yabuuchi, Chief Scientist at the Japan Synchrotron Radiation Research Institute; and Yuji Fukuda, Senior Principal Researcher at the Kansai Institute for Photon Science (KPSI), National Institutes for Quantum Science and Technology (QST)—has developed a new measurement technique that simultaneously captures diffraction signals ranging from ultra-small angles to wide angles with a single camera when a single X-ray pulse is irradiated onto a structure. By combining this method with an X-ray free-electron laser, the team derived the rarefaction velocity of high-energy-density plasma on a picosecond timescale across a broad range of spatial scales—from nanometers to submicrometers. A comparison of experimental results and numerical simulations revealed that even an increase of just a few nanometers in the size of the initial plasma on a solid surface reduces the efficiency with which the laser is absorbed by the microstructured solid to approximately one-fourth.
- Journal
- Communications Physics