Water-triggered PVA film switches from bioplastic to high-performance wood adhesive
Peer-Reviewed Publication
Updates every hour. Last Updated: 26-Oct-2026 17:17 ET (26-Oct-2026 21:17 GMT/UTC)
Pixels create images on screens or capture them in cameras. Until now, however, there have been no pixels that could do both. Researchers have now developed a new kind of pixel that can both create and analyse images and patterns. In the future, these pixels could be used to realise two-way camera–displays.
By leveraging a classical mathematical function, researchers at the Simons Foundation’s Flatiron Institute developed a new method that enables molecular dynamics simulations to run 2.5 to seven times as fast — all without sacrificing accuracy. For the most popular software package for molecular dynamics simulations, GROMACS, the researchers achieved a fivefold speed increase in simulations run at high accuracy.
Researchers at the National Center for Tumor Diseases (NCT/UCC) in Dresden, including Prof. Oliver Bruns and Dr. Bernardo Arús, are participating in an international study that has, for the first time, developed completely novel proteins for near-infrared (NIR) and short-wave infrared imaging (SWIR). The research was conducted in collaboration with an international team that included chemistry Nobel laureate Prof. David Baker, who was honored in 2024 for his work on computational protein design. The study, with shared first authorship, was recently published in the Journal of the American Chemical Society (JACS), one of the world's leading chemistry journals.
A tandem neural network capable of inferring key physical parameters of semiconductor materials from simple transistor measurements has been developed, as reported by researchers from Institute of Science Tokyo. While conventional approaches for this type of analysis require hours or even days, the proposed system produces results in under one millisecond with near-perfect accuracy.
A newly developed laser Speckle-based Curvature Optical Metrology (SCOM) system is enabling high-precision, two-dimensional curvature mapping of strongly curved and freeform X-ray mirrors—expanding the boundaries of optical fabrication and beamline performance.